Volume -39 | Issue - 2
Volume -39 | Issue - 2
Volume -39 | Issue - 2
Volume -39 | Issue - 2
Volume -39 | Issue - 2
Aim: The current and voltage characteristics of FinFET and single gate MOSFET are simulated by varying their oxide thickness ranging from 2 nm to 20 nm. Materials and Methods: The electrical conductance of FINFET (n= 320) was compared with MOSFET (n=320) by varying oxide thickness ranging from 2 nm to 20 nm in the NANO HUB tool simulation environment.