2564-7814

Electrical Characterization of TiO2 based OMEGA FinFET Compared with Conventional SiO2 Material

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K. Jonah Swabhijit • J. Mohana

Abstract

Aim: The aim of the study is to perform the electrical characterization of Innovative TiO2 based Omega FinFET and compare it with SiO2 material by varying the oxide thickness ranging from 1nm to 20nm using nanotechnology. Materials and Methods: DFT tool is used to perform the above characterisation.

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